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Automatized system of optical measurements of liquid crystal elements with improved output signal characteristics
- Authors: Usachev V.V.1, Belyaev V.V.1,2, Chausov D.N.2,3, Moyseenko S.V.1,4
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Affiliations:
- Peoples’ Friendship University of Russia (RUDN University)
- Moscow Region State University
- Prokhorov General Physics Institute of the Russian Academy of Sciences
- JSC “ALPHA-BANK”
- Issue: Vol 23, No 2 (2022)
- Pages: 117-123
- Section: Articles
- URL: https://journals.rudn.ru/engineering-researches/article/view/31717
- DOI: https://doi.org/10.22363/2312-8143-2022-23-2-117-123
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Abstract
The article discusses the developed automated system for the research of a liquid crystal cell, which consists of hardware and software parts. Unlike previously developed devices for optical measurements of liquid crystal elements, the automated system under consideration provides signal generation accuracy within 0.5% and SFDR noise immunity of at least 80 dB. The hardware part of the system includes the development of a circuit for generating a voltage signal of a certain amplitude and frequency, the formation of signals for controlling the movement of a stepper motor and controlling the intensity of the luminous flux of four laser LEDs, the development and tracing of a printed circuit board. The software part consists in the development of an applied executive algorithm that builds a sinusoidal signal at the output of a digital-to-analog converter of a microcontroller. This example uses the STM32F746IGT6 microcontroller based on the ARM Cortex-M7 core, which has a superscalar architecture with dynamic prediction, a memory protection module, a floating-point computing unit, as well as a direct memory access controller DMA (direct memory access), which is used for accelerated data exchange between memory and peripherals. The DMA is used to quickly control the digital-to-analog converter.
About the authors
Vladimir V. Usachev
Peoples’ Friendship University of Russia (RUDN University)
Email: usahev.burevestnik@yandex.ru
ORCID iD: 0000-0002-1616-7062
PhD student, Department of Nanotechnology and Microsystem Technology, Academy of Engineering
6 Miklukho-Maklaya St, Moscow, 117198, Russian FederationVictor V. Belyaev
Peoples’ Friendship University of Russia (RUDN University); Moscow Region State University
Email: belyaev-vv@rudn.ru
ORCID iD: 0000-0003-0553-9358
Doctor of Technical Sciences, Professor of the Department of Nanotechnology and Microsystem Technology, Academy of Engineering, Peoples’ Friendship University of Russia (RUDN University); Professor of the Theoretical Physics Department, Moscow Region State University
6 Miklukho-Maklaya St, Moscow, 117198, Russian Federation; 24 Very Voloshinoy St, Mytishi, 141014, Russian FederationDenis N. Chausov
Moscow Region State University; Prokhorov General Physics Institute of the Russian Academy of Sciences
Email: d.chausov@yandex.ru
ORCID iD: 0000-0002-1287-6427
D.Sc., Head of Theoretical and Applied Nanotechnology Laboratory, Professor of the Theoretical Physics Department, Moscow Region State University; senior researcher, Prokhorov General Physics Institute, Russian Academy of Sciences
24 Very Voloshinoy St, Mytishi, 141014, Russian Federation; 38 Vavilova St, Moscow, 119991, Russian FederationSergey V. Moyseenko
Peoples’ Friendship University of Russia (RUDN University); JSC “ALPHA-BANK”
Author for correspondence.
Email: cormorant.xiii@gmail.com
ORCID iD: 0000-0002-8555-4234
PhD student, Department of Nanotechnology and Microsystem Technology, Academy of Engineering, Peoples’ Friendship University of Russia (RUDN University); leading specialist, Joint Stock Company “ALPHA-BANK”
6 Miklukho-Maklaya St, Moscow, 117198, Russian Federation; 27 Kalanchevskaya St, Moscow, 107078, Russian FederationReferences
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- Bondarenko MV, Slyusar VI. The influence of ADC jitter on the accuracy of direction finding by digital antenna arrays. Izvestiya of Higher Educational Institutions. Radio Electronics. 2011;54(8):41–49. (In Russ.)
