Fourier Analysis of Interferograms Formed by Surface-Plasmons Generated by Terahertz Synchrotron Radiation

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Abstract

The problem of Fourier analysis of interferograms formed in terahertz (THz) synchrotron parallel beams, one of which is produced by surface plasmons (SPs) running along the surface of a conducting sample placed in one of the Mach-Zehnder interferometer arms, is considered in the paper. It is demonstrated that the analytical procedure employing the complete Fourier transform of the interferograms, got while scanning the movable mirror in the reference arm and registered at two distances run by the SPs, enables one to obtain the THz SPs complex refractive index spectrum and thus - the spectrum of the sample complex dielectric permittivity. Employment of a synchrotron source in SPs Fourier spectrometers raises the signal to noise ratio as compared to the blackbody emitter by a factor of 108 and facilitates the calibration procedure as synchrotron radiation intensity is in direct proportion to its frequency.

About the authors

G N Zhizhin

Scientific and Technological Center for Unique Instrumentation of RAS

Scientific and Technological Center for Unique Instrumentation of RAS

A P Kyrianov

Scientific and Technological Center for Unique Instrumentation of RAS

Scientific and Technological Center for Unique Instrumentation of RAS

N I Golovtsov

People's Friendship University of Russia

Кафедра общей физики; Российский университет дружбы народов; People's Friendship University of Russia

O V Khitrov

Close corporation "Sukhoi Civil Aircraft Company"

Email: holeg21@mail.ru
Close corporation "Sukhoi Civil Aircraft Company"

A K Nikitin

Novosibirsk State University

Email: alnikitin@mail.ru
Novosibirsk State University

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Copyright (c) 2012 Жижин Г.Н., Кирьянов А.П., Головцов Н.И., Хитров О.В., Никитин А.К.

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