Dielectric Spectroscopy of thin Films at Terahertz Frequencies

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Abstract

The problem of thin film dielectric spectroscopy at terahertz (THz) frequencies is under study in the paper. It has been stated that the technique employing surface plasmons (SP) excitation by the probing radiation on the metal substrate surface can be effectively used for solving the problem. To adopt the SP spectroscopy technique to the THz range we have developed a number of methods and devices making possible to determine the SP's complex refractive index depending on the film's optical properties. Some of the methods are based on interference of bulk and (or) surface waves, others - on the intensity measurements of the SP field. In addition the methods developed enable one to perform the measurements for one pulse duration of the radiation.

About the authors

G N Zhizhin

Scientific and Technological Center for Unique Instrumentation of RAS

Email: gzhizhin@mail.ru
Scientific and Technological Center for Unique Instrumentation of RAS

N I Golovtsov

Peoples Friendship University of Russia

Кафедра общей физики; Российский университет дружбы народов; Peoples Friendship University of Russia

A P Loginov

Peoples Friendship University of Russia

Кафедра общей физики; Российский университет дружбы народов; Peoples Friendship University of Russia

A K Nikitin

Scientific and Technological Center for Unique Instrumentation of RAS

Email: alnikitin@mail.ru
Scientific and Technological Center for Unique Instrumentation of RAS

T A Ryzhova

Peoples Friendship University of Russia

Кафедра общей физики; Российский университет дружбы народов; Peoples Friendship University of Russia

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Copyright (c) 2011 Жижин Г.Н., Головцов Н.И., Логинов А.П., Никитин А.К., Рыжова Т.А.

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This work is licensed under a Creative Commons Attribution 4.0 International License.

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