Dielectric Spectroscopy of thin Films at Terahertz Frequencies

G N Zhizhin; Жижин Герман Николаевич; N I Golovtsov; Головцов Николай Иванович; A P Loginov; Логинов Альберт Питиримович; A K Nikitin; Никитин Алексей Константинович; T A Ryzhova; Рыжова Татьяна Александровна

Dielectric Spectroscopy of thin Films at Terahertz Frequencies

Authors: Zhizhin GN¹, Golovtsov NI², Loginov AP², Nikitin AK¹, Ryzhova TA²
Affiliations:
1. Scientific and Technological Center for Unique Instrumentation of RAS
2. Peoples Friendship University of Russia
Issue: No 2 (2011)
Pages: 133-147
Section: Articles
URL: https://journals.rudn.ru/miph/article/view/8747

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Abstract

The problem of thin ﬁlm dielectric spectroscopy at terahertz (THz) frequencies is under study in the paper. It has been stated that the technique employing surface plasmons (SP) excitation by the probing radiation on the metal substrate surface can be eﬀectively used for solving the problem. To adopt the SP spectroscopy technique to the THz range we have developed a number of methods and devices making possible to determine the SP's complex refractive index depending on the ﬁlm's optical properties. Some of the methods are based on interference of bulk and (or) surface waves, others - on the intensity measurements of the SP ﬁeld. In addition the methods developed enable one to perform the measurements for one pulse duration of the radiation.

Keywords

dielectric spectroscopy, terahertz radiation, surface plasmons, thin ﬁlms, interferometry, surface electromagnetic waves, optical constants

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Vol 31, No 4 (2023)

Dielectric Spectroscopy of thin Films at Terahertz Frequencies

Full Text

Abstract

Keywords

About the authors

G N Zhizhin

N I Golovtsov

A P Loginov

A K Nikitin

T A Ryzhova

References

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