## Optical Characterization of a Thin-Film Material Based on Light Intensity Measurements

**Authors:**Lovetskiy K.P., Nikolaev N.E., Sevastianov A.L.**Issue:**Vol 26, No 3 (2018)**Pages:**252-260**Section:**Mathematical Modeling**URL:**http://journals.rudn.ru/miph/article/view/18990**DOI:**http://dx.doi.org/10.22363/2312-9735-2018-26-3-252-260

#### Abstract

### K P Lovetskiy

Peoples’ Friendship University of Russia (RUDN university)
**Author for correspondence.**

Email: lovetskiy_kp@rudn.university

6, Miklukho-Maklaya str., Moscow, 117198, Russian Federation Candidate of Physical and Mathematical Sciences, Associate Professor of Department of Applied Probability and Informatics of Peoples’ Friendship University of Russia (RUDN University)

### N E Nikolaev

Peoples’ Friendship University of Russia (RUDN university)
Email: nikolaev_ne@pfur.ru

6, Miklukho-Maklaya str., Moscow, 117198, Russian Federation Candidate of Physical and Mathematical Sciences, Associate Professor of Institute of Physical Research and Technologies of Peoples’ Friendship University of Russia (RUDN university)

### A L Sevastianov

Peoples’ Friendship University of Russia (RUDN university)
Email: sevastianov_al@rudn.university

6, Miklukho-Maklaya str., Moscow, 117198, Russian Federation Candidate of Physical and Mathematical Sciences, Associate Professor of Department of Applied Probability and Informatics of Peoples’ Friendship University of Russia (RUDN University)

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