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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">RUDN Journal of Ecology and Life Safety</journal-id><journal-title-group><journal-title xml:lang="en">RUDN Journal of Ecology and Life Safety</journal-title><trans-title-group xml:lang="ru"><trans-title>Вестник Российского университета дружбы народов. Серия: Экология и безопасность жизнедеятельности</trans-title></trans-title-group></journal-title-group><issn publication-format="print">2313-2310</issn><issn publication-format="electronic">2408-8919</issn><publisher><publisher-name xml:lang="en">Peoples’ Friendship University of Russia named after Patrice Lumumba (RUDN University)</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">47550</article-id><article-id pub-id-type="doi">10.22363/2313-2310-2025-33-4-467-476</article-id><article-id pub-id-type="edn">ILJLFQ</article-id><article-categories><subj-group subj-group-type="toc-heading" xml:lang="en"><subject>Geoecology</subject></subj-group><subj-group subj-group-type="toc-heading" xml:lang="ru"><subject>Геоэкология</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Electronic waste as a source of heavy metal contamination of soils: leaching dynamics under simulated landfill conditions</article-title><trans-title-group xml:lang="ru"><trans-title>Электронные отходы как источник загрязнения почв тяжелыми металлами: динамика выщелачивания в условиях имитации полигона отходов</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0009-1107-4922</contrib-id><contrib-id contrib-id-type="spin">2500-8186</contrib-id><name-alternatives><name xml:lang="en"><surname>Ostanniy</surname><given-names>Daniil A.</given-names></name><name xml:lang="ru"><surname>Останний</surname><given-names>Даниил Александрович</given-names></name></name-alternatives><bio xml:lang="en"><p>Postgraduate student, Faculty of Comprehensive Security and Military Training</p></bio><bio xml:lang="ru"><p>аспирант, факультет комплексной безопасности и основ военной подготовки</p></bio><email>daostanny@ya.ru</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-4943-8946</contrib-id><contrib-id contrib-id-type="spin">6603-6401</contrib-id><name-alternatives><name xml:lang="en"><surname>Shakhramanyan</surname><given-names>Mikhail A.</given-names></name><name xml:lang="ru"><surname>Шахраманьян</surname><given-names>Михаил Андраникович</given-names></name></name-alternatives><bio xml:lang="en"><p>Honored Scientist of the Russian Federation, Doctor of Technical Sciences, Professor, Financial University under the Government of the Russian Federation, Academician of the Russian Academy of Natural Sciences (RAEN).</p></bio><bio xml:lang="ru"><p>заслуженный деятель науки РФ, доктор технических наук, профессор, Финансовый университет при Правительстве РФ, академик РАЕН</p></bio><email>shahramanianma@corp-univer.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">Russian State Social University</institution></aff><aff><institution xml:lang="ru">Российский государственный социальный университет</institution></aff></aff-alternatives><aff-alternatives id="aff2"><aff><institution xml:lang="en">Financial University under the Government of the Russian Federation</institution></aff><aff><institution xml:lang="ru">Финансовый университет при Правительстве РФ</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2025-12-15" publication-format="electronic"><day>15</day><month>12</month><year>2025</year></pub-date><volume>33</volume><issue>4</issue><issue-title xml:lang="en">Green Economy: Challenges and Prospects</issue-title><issue-title xml:lang="ru">Зеленая экономика: вызовы и перспективы</issue-title><fpage>467</fpage><lpage>476</lpage><history><date date-type="received" iso-8601-date="2025-12-09"><day>09</day><month>12</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2025, Ostanniy D.A., Shakhramanyan M.A.</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2025, Останний Д.А., Шахраманьян М.А.</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="en">Ostanniy D.A., Shakhramanyan M.A.</copyright-holder><copyright-holder xml:lang="ru">Останний Д.А., Шахраманьян М.А.</copyright-holder><ali:free_to_read xmlns:ali="http://www.niso.org/schemas/ali/1.0/"/><license><ali:license_ref xmlns:ali="http://www.niso.org/schemas/ali/1.0/">https://creativecommons.org/licenses/by-nc/4.0</ali:license_ref></license></permissions><self-uri xlink:href="https://journals.rudn.ru/ecology/article/view/47550">https://journals.rudn.ru/ecology/article/view/47550</self-uri><abstract xml:lang="en"><p>Electronic waste poses a serious environmental threat due to the content of heavy metals. The aim of the work is to evaluate the leaching of heavy metals (Cu, Pb, Zn, Cd, Cr, Ni) from printed circuit boards and cables under simulated urban landfill conditions (SPLP method, 8 cycles). E-waste was found to be a significant source of contamination. Printed circuit boards showed a gradual increase in the concentrations of Cu (up to 2.33 mg/L), Pb (up to 0.666 mg/L) and Zn (up to 1.385 mg/L) in the leachate. The cables were characterized by high initial Cu removal (3.50 mg/L) followed by a decrease. A heuristic risk assessment model was developed.</p></abstract><trans-abstract xml:lang="ru"><p>Электронные отходы представляют серьезную экологическую угрозу из-за содержания тяжелых металлов. Цель исследования - оценка выщелачивания тяжелых металлов (Cu, Pb, Zn, Cd, Cr, Ni) из печатных плат и кабелей в условиях имитации городской свалки (метод SPLP, 8 циклов). Установлено, что электронные отходы являются значимым источником загрязнения. Печатные платы демонстрировали постепенный рост концентраций Cu (до 2,33 мг/л), Pb (до 0,666 мг/л) и Zn (до 1,385 мг/л) в фильтрате. Для кабелей был характерен высокий начальный вынос Cu (3,50 мг/л) с последующим снижением. Разработана эвристическая модель оценки риска.</p></trans-abstract><kwd-group xml:lang="en"><kwd>electronic waste</kwd><kwd>heavy metals</kwd><kwd>leaching</kwd><kwd>soil contamination</kwd><kwd>environmental risk</kwd><kwd>printed circuit boards</kwd><kwd>cables</kwd><kwd>leachate</kwd><kwd>municipal landfill</kwd><kwd>modeling</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>электронные отходы</kwd><kwd>тяжелые металлы</kwd><kwd>выщелачивание</kwd><kwd>загрязнение почв</kwd><kwd>экологический риск</kwd><kwd>печатные платы</kwd><kwd>кабели</kwd><kwd>фильтрат</kwd><kwd>городская свалка</kwd><kwd>моделирование</kwd></kwd-group><funding-group/></article-meta><fn-group/></front><body></body><back><ref-list><ref id="B1"><label>1.</label><citation-alternatives><mixed-citation xml:lang="en">Adu JT, Aneke FI. Evaluation of heavy metal contamination in landfills from e-waste disposal and its potential as a pollution source for surface water bodies. 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