Issue Title
Vol 26, No 3 (2018) Optical Characterization of a Thin-Film Material Based on Light Intensity Measurements
Abstract PDF
(Eng)
Lovetskiy K.P., Nikolaev N.E., Sevastianov A.L.
No 1 (2012) Fourier Analysis of Interferograms Formed by Surface-Plasmons Generated by Terahertz Synchrotron Radiation
Abstract PDF
(Rus)
Zhizhin G.N., Kyrianov A.P., Golovtsov N.I., Khitrov O.V., Nikitin A.K.
No 3 (2014) Properties of Titanium Dioxide Thin Films, Fabricated by Gel Methods
Abstract PDF
(Eng)
Trofimov N.S.
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