Author Details
Шапкарин, Игорь Петрович, Московский государственный университет дизайна и технологий
| Issue | Section | Title | File |
| No 1 (2012) | Articles | Interference Holoellipsometry "in situ" of a Transparent Two-Dimensional Uniaxial Crystal at Normal Angle Laser Radiation Reflection |
 (Rus) |